Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

ग्रंथसूची विवरण
मुख्य लेखकों:	Behan, G, Nellist, P
स्वरूप:	Conference item
प्रकाशित:	2008

Optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
द्वारा: Behan, G, और अन्य
प्रकाशित: (2009)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
द्वारा: Nellist, P, और अन्य
प्रकाशित: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
द्वारा: Nellist, P, और अन्य
प्रकाशित: (2008)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
द्वारा: Wang, P, और अन्य
प्रकाशित: (2009)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
द्वारा: Nellist, P, और अन्य
प्रकाशित: (2008)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
द्वारा: Behan, G, और अन्य
प्रकाशित: (2009)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
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Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
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Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
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Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
द्वारा: Cosgriff, E, और अन्य
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Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
द्वारा: Jones, L, और अन्य
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Confocal operation of a transmission electron microscope with two aberration correctors
द्वारा: Nellist, P, और अन्य
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Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope
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Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

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