Imaging crystallographic phases using time-of-flight neutron diffraction

Identification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases...

Повний опис

Бібліографічні деталі
Автори: Gutmann, M, Kockelmann, W, Chapon, L, Radaelli, P
Формат: Conference item
Опубліковано: 2006
Опис
Резюме:Identification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases along the incident beam path through the thickness of the material to be reconstructed. Phase reconstruction is demonstrated on a benchmark object. © 2006 Elsevier B.V. All rights reserved.