Imaging crystallographic phases using time-of-flight neutron diffraction
Identification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases...
| Main Authors: | , , , |
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| Format: | Conference item |
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2006
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| _version_ | 1826305662091526144 |
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| author | Gutmann, M Kockelmann, W Chapon, L Radaelli, P |
| author_facet | Gutmann, M Kockelmann, W Chapon, L Radaelli, P |
| author_sort | Gutmann, M |
| collection | OXFORD |
| description | Identification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases along the incident beam path through the thickness of the material to be reconstructed. Phase reconstruction is demonstrated on a benchmark object. © 2006 Elsevier B.V. All rights reserved. |
| first_indexed | 2024-03-07T06:36:14Z |
| format | Conference item |
| id | oxford-uuid:f7bc0e69-1f9c-4b05-bef7-bd73c2da1d22 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T06:36:14Z |
| publishDate | 2006 |
| record_format | dspace |
| spelling | oxford-uuid:f7bc0e69-1f9c-4b05-bef7-bd73c2da1d222022-03-27T12:44:55ZImaging crystallographic phases using time-of-flight neutron diffractionConference itemhttp://purl.org/coar/resource_type/c_5794uuid:f7bc0e69-1f9c-4b05-bef7-bd73c2da1d22Symplectic Elements at Oxford2006Gutmann, MKockelmann, WChapon, LRadaelli, PIdentification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases along the incident beam path through the thickness of the material to be reconstructed. Phase reconstruction is demonstrated on a benchmark object. © 2006 Elsevier B.V. All rights reserved. |
| spellingShingle | Gutmann, M Kockelmann, W Chapon, L Radaelli, P Imaging crystallographic phases using time-of-flight neutron diffraction |
| title | Imaging crystallographic phases using time-of-flight neutron diffraction |
| title_full | Imaging crystallographic phases using time-of-flight neutron diffraction |
| title_fullStr | Imaging crystallographic phases using time-of-flight neutron diffraction |
| title_full_unstemmed | Imaging crystallographic phases using time-of-flight neutron diffraction |
| title_short | Imaging crystallographic phases using time-of-flight neutron diffraction |
| title_sort | imaging crystallographic phases using time of flight neutron diffraction |
| work_keys_str_mv | AT gutmannm imagingcrystallographicphasesusingtimeofflightneutrondiffraction AT kockelmannw imagingcrystallographicphasesusingtimeofflightneutrondiffraction AT chaponl imagingcrystallographicphasesusingtimeofflightneutrondiffraction AT radaellip imagingcrystallographicphasesusingtimeofflightneutrondiffraction |