$Imaging crystallographic phases using time-of-flight neutron diffraction$

Imaging crystallographic phases using time-of-flight neutron diffraction

Identification and imaging of crystallographic phases inside an object can be achieved by time-of-flight neutron diffraction, based on a correction formula that is usually used to account for a sample offset on a powder diffractometer. The procedure allows the distribution of crystallographic phases...

書誌詳細
主要な著者:	Gutmann, M, Kockelmann, W, Chapon, L, Radaelli, P
フォーマット:	Conference item
出版事項:	2006

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