NanoSIMS imaging and analysis in materials science
High-resolution SIMS analysis can be used to explore a wide range of problems in material science and engineering materials, especially when chemical imaging with good spatial resolution (50–100 nm) can be combined with efficient detection of light elements and precise separation of isotopes and iso...
| Autores principales: | , , , |
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| Formato: | Journal article |
| Lenguaje: | English |
| Publicado: |
Annual Reviews
2020
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| _version_ | 1826305694916149248 |
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| author | Li, K Liu, J Grovenor, CRM Moore, KL |
| author_facet | Li, K Liu, J Grovenor, CRM Moore, KL |
| author_sort | Li, K |
| collection | OXFORD |
| description | High-resolution SIMS analysis can be used to explore a wide range of problems in material science and engineering materials, especially when chemical imaging with good spatial resolution (50–100 nm) can be combined with efficient detection of light elements and precise separation of isotopes and isobaric species. Here, applications of the NanoSIMS instrument in the analysis of inorganic materials are reviewed, focusing on areas of current interest in the development of new materials and degradation mechanisms under service conditions. We have chosen examples illustrating NanoSIMS analysis of grain boundary segregation, chemical processes in cracking, and corrosion of nuclear components. An area where NanoSIMS analysis shows potential is in the localization of light elements, in particular, hydrogen and deuterium. Hydrogen embrittlement is a serious problem for industries where safety is critical, including aerospace, nuclear, and oil/gas, so it is imperative to know where in the microstructure hydrogen is located. By charging the metal with deuterium, to avoid uncertainty in the origin of the hydrogen, the microstructural features that can trap hydrogenic species, such as precipitates and grain and phase boundaries, can be determined by NanoSIMS analysis on a microstructurally relevant scale. |
| first_indexed | 2024-03-07T06:36:44Z |
| format | Journal article |
| id | oxford-uuid:f7e913c3-5d2a-46a6-8ac2-2be5f66bf1e3 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T06:36:44Z |
| publishDate | 2020 |
| publisher | Annual Reviews |
| record_format | dspace |
| spelling | oxford-uuid:f7e913c3-5d2a-46a6-8ac2-2be5f66bf1e32022-03-27T12:46:14ZNanoSIMS imaging and analysis in materials scienceJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:f7e913c3-5d2a-46a6-8ac2-2be5f66bf1e3EnglishSymplectic ElementsAnnual Reviews2020Li, KLiu, JGrovenor, CRMMoore, KLHigh-resolution SIMS analysis can be used to explore a wide range of problems in material science and engineering materials, especially when chemical imaging with good spatial resolution (50–100 nm) can be combined with efficient detection of light elements and precise separation of isotopes and isobaric species. Here, applications of the NanoSIMS instrument in the analysis of inorganic materials are reviewed, focusing on areas of current interest in the development of new materials and degradation mechanisms under service conditions. We have chosen examples illustrating NanoSIMS analysis of grain boundary segregation, chemical processes in cracking, and corrosion of nuclear components. An area where NanoSIMS analysis shows potential is in the localization of light elements, in particular, hydrogen and deuterium. Hydrogen embrittlement is a serious problem for industries where safety is critical, including aerospace, nuclear, and oil/gas, so it is imperative to know where in the microstructure hydrogen is located. By charging the metal with deuterium, to avoid uncertainty in the origin of the hydrogen, the microstructural features that can trap hydrogenic species, such as precipitates and grain and phase boundaries, can be determined by NanoSIMS analysis on a microstructurally relevant scale. |
| spellingShingle | Li, K Liu, J Grovenor, CRM Moore, KL NanoSIMS imaging and analysis in materials science |
| title | NanoSIMS imaging and analysis in materials science |
| title_full | NanoSIMS imaging and analysis in materials science |
| title_fullStr | NanoSIMS imaging and analysis in materials science |
| title_full_unstemmed | NanoSIMS imaging and analysis in materials science |
| title_short | NanoSIMS imaging and analysis in materials science |
| title_sort | nanosims imaging and analysis in materials science |
| work_keys_str_mv | AT lik nanosimsimagingandanalysisinmaterialsscience AT liuj nanosimsimagingandanalysisinmaterialsscience AT grovenorcrm nanosimsimagingandanalysisinmaterialsscience AT moorekl nanosimsimagingandanalysisinmaterialsscience |