NanoSIMS imaging and analysis in materials science

High-resolution SIMS analysis can be used to explore a wide range of problems in material science and engineering materials, especially when chemical imaging with good spatial resolution (50–100 nm) can be combined with efficient detection of light elements and precise separation of isotopes and iso...

詳細記述

書誌詳細
主要な著者: Li, K, Liu, J, Grovenor, CRM, Moore, KL
フォーマット: Journal article
言語:English
出版事項: Annual Reviews 2020

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