THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

Manylion Llyfryddiaeth
Prif Awdur:	Cockayne, D
Fformat:	Journal article
Cyhoeddwyd:	1972

Eitemau Tebyg

WEAK-BEAM ELECTRON-MICROSCOPY
gan: Cockayne, D
Cyhoeddwyd: (1981)

PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
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Applications of the weak beam technique of electron microscopy
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DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
gan: Cockayne, D, et al.
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STUDY OF GUINIER-PRESTON ZONES IN ALUMINUM-COPPER ALLOYS USING WEAK-BEAM TECHNIQUE OF ELECTRON-MICROSCOPY
gan: Yoshida, H, et al.
Cyhoeddwyd: (1976)

DETERMINATION OF GEOMETRY AND NATURE OF SMALL FRANK LOOPS USING WEAK-BEAM METHOD
gan: Jenkins, M, et al.
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The benefits of energy-filtering in weak-beam microscopy
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WEAK-BEAM ELECTRON-MICROSCOPY ANALYSIS OF DEFECT CLUSTERS IN HEAVY-ION IRRADIATED SILVER AND COPPER
gan: Jenkins, M
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STUDIES OF LATTICE-DEFECTS USING WEAK DIFFRACTED BEAMS
gan: Cockayne, D, et al.
Cyhoeddwyd: (1975)

CALCULATED ASYMMETRY FOR WEAK BEAM INTRINSIC STACKING-FAULT IMAGES
gan: Wilson, A, et al.
Cyhoeddwyd: (1985)

INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS
gan: Cockayne, D, et al.
Cyhoeddwyd: (1969)

ADVANCED TECHNIQUES OF ELECTRON-MICROSCOPY FOR STUDYING MATERIALS
gan: Cockayne, D
Cyhoeddwyd: (1985)

13TH AUSTRALIAN CONFERENCE ON ELECTRON-MICROSCOPY, FEBRUARY-1994
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WEAK-BEAM TECHNIQUE APPLIED TO SUPERLATTICE DISLOCATIONS IN AN IRON-ALUMINIUM ALLOY
gan: Ray, I, et al.
Cyhoeddwyd: (1970)

POTENTIALITIES AND LIMITATIONS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CRYSTAL LATTICES AND THEIR IMPERFECTIONS
gan: Cockayne, D
Cyhoeddwyd: (1975)

Automatic beam optimization method for scanning electron microscopy based on electron beam Kernel estimation
gan: Yunje Cho, et al.
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Transmission electron microscopy investigation of semiconductor quantum dots
gan: Liao, X, et al.
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New possibilities with aberration-corrected electron microscopy.
gan: Cockayne, D, et al.
Cyhoeddwyd: (2009)

Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
gan: Nellist, P, et al.
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Electron-beam broadening in electron microscopy by solving the electron transport equation
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WEAK-BEAM TECHNIQUE APPLIED TO SUPERLATTICE DISLOCATIONS IN IRON-ALUMINUM ALLOYS .2. FOURFOLD DISSOCIATION IN DO3-TYPE ORDER
gan: Crawford, R, et al.
Cyhoeddwyd: (1973)

Microscopy of materials: modern imaging methods using electron,x-ray and ion beams /
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Techniques for Reducing Beam-Induced Damage in Electron Microscopy
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Photoemission sources and beam blankers for ultrafast electron microscopy
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The cage effect of electron beam irradiation damage in cryo-electron microscopy
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Correlative Analysis of Immunoreactivity in Confocal Laser-Scanning Microscopy and Scanning Electron Microscopy with Focused Ion Beam Milling
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AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES
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Electron-beam patterned calibration structures for structured illumination microscopy
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Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
gan: McBride, W, et al.
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Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
gan: Langford, R, et al.
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CRITICAL THICKNESS DETERMINATION OF INXGA1-XAS/GAAS STRAINED-LAYER SYSTEM BY TRANSMISSION ELECTRON-MICROSCOPY
gan: Zou, J, et al.
Cyhoeddwyd: (1991)

Celebrations in Pioneering Electron Microscopy: A Symposium in Honor of Professor Archie Howie-Introduction.
gan: Gai, P, et al.
Cyhoeddwyd: (2000)

Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate
gan: Zou, J, et al.
Cyhoeddwyd: (1999)

Electron microscopy : methods and protocols /
gan: Kuo, John
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Hypothesis for a mechanism of beam-induced motion in cryo-electron microscopy
gan: Robert E. Thorne
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3D magnetic imaging using electron vortex beam microscopy
gan: Frank Barrows, et al.
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Active control of bright electron beams with RF optics for femtosecond microscopy
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OPTIMIZATION AND CHARACTERIZATION OF ELECTRON BEAM RESIST USING ATOMIC FORCE MICROSCOPY
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A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy
gan: Ming, W, et al.
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Weakly Supervised Image Segmentation for Detecting Defects From Scanning Electron Microscopy Images in Semiconductor
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