Elementary surface acoustic wave effects studied by scanning acoustic force microscopy
Scanning Acoustic Force Microscopy (SAFM) has been used to study elementary surface acoustic wave phenomena with nanoscale spatial resolution. The SAFM technique is capable of detecting acoustic wave properties of arbitrarily polarized modes with sub-wavelength resolution and unmatched sensitivity....
| 主要な著者: | , |
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| フォーマット: | Conference item |
| 出版事項: |
2000
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| _version_ | 1826305986843901952 |
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| author | Hesjedal, T Behme, G |
| author_facet | Hesjedal, T Behme, G |
| author_sort | Hesjedal, T |
| collection | OXFORD |
| description | Scanning Acoustic Force Microscopy (SAFM) has been used to study elementary surface acoustic wave phenomena with nanoscale spatial resolution. The SAFM technique is capable of detecting acoustic wave properties of arbitrarily polarized modes with sub-wavelength resolution and unmatched sensitivity. Elementary model systems like symmetric single finger wave sources and circular wave sources are studied for the first time in detail. |
| first_indexed | 2024-03-07T06:41:06Z |
| format | Conference item |
| id | oxford-uuid:f94e2ac3-2da5-454e-9740-dad9bce3f315 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T06:41:06Z |
| publishDate | 2000 |
| record_format | dspace |
| spelling | oxford-uuid:f94e2ac3-2da5-454e-9740-dad9bce3f3152022-03-27T12:57:04ZElementary surface acoustic wave effects studied by scanning acoustic force microscopyConference itemhttp://purl.org/coar/resource_type/c_5794uuid:f94e2ac3-2da5-454e-9740-dad9bce3f315Symplectic Elements at Oxford2000Hesjedal, TBehme, GScanning Acoustic Force Microscopy (SAFM) has been used to study elementary surface acoustic wave phenomena with nanoscale spatial resolution. The SAFM technique is capable of detecting acoustic wave properties of arbitrarily polarized modes with sub-wavelength resolution and unmatched sensitivity. Elementary model systems like symmetric single finger wave sources and circular wave sources are studied for the first time in detail. |
| spellingShingle | Hesjedal, T Behme, G Elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| title | Elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| title_full | Elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| title_fullStr | Elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| title_full_unstemmed | Elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| title_short | Elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| title_sort | elementary surface acoustic wave effects studied by scanning acoustic force microscopy |
| work_keys_str_mv | AT hesjedalt elementarysurfaceacousticwaveeffectsstudiedbyscanningacousticforcemicroscopy AT behmeg elementarysurfaceacousticwaveeffectsstudiedbyscanningacousticforcemicroscopy |