Elementary surface acoustic wave effects studied by scanning acoustic force microscopy

Elementary surface acoustic wave effects studied by scanning acoustic force microscopy

Scanning Acoustic Force Microscopy (SAFM) has been used to study elementary surface acoustic wave phenomena with nanoscale spatial resolution. The SAFM technique is capable of detecting acoustic wave properties of arbitrarily polarized modes with sub-wavelength resolution and unmatched sensitivity....

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Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Hesjedal, T, Behme, G
Formáid:	Conference item
Foilsithe / Cruthaithe:	2000

Míreanna comhchosúla

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