Elementary surface acoustic wave effects studied by scanning acoustic force microscopy
Scanning Acoustic Force Microscopy (SAFM) has been used to study elementary surface acoustic wave phenomena with nanoscale spatial resolution. The SAFM technique is capable of detecting acoustic wave properties of arbitrarily polarized modes with sub-wavelength resolution and unmatched sensitivity....
| Main Authors: | , |
|---|---|
| 格式: | Conference item |
| 出版: |
2000
|