$Annealing of focused ion beam damage in gold microcrystals: an in situ Bragg coherent X-ray diffraction imaging study$

Annealing of focused ion beam damage in gold microcrystals: an in situ Bragg coherent X-ray diffraction imaging study

Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been developed to reduce FIB-induced strain; however, these prot...

書目詳細資料
Main Authors:	Yang, D, Phillips, NW, Song, K, Harder, RJ, Cha, W, Hofmann, F
格式:	Journal article
語言:	English
出版:	International Union of Crystallography 2021

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