Simulation of specimen-induced aberrations for objects with spherical and cylindrical symmetry.

Wavefront aberrations caused by the refractive index structure of the specimen are known to compromise signal intensity and three-dimensional resolution in confocal and multiphoton microscopy. However, adaptive optics can measure and correct specimen-induced aberrations. For the design of an adaptiv...

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Những tác giả chính: Schwertner, M, Booth, M, Wilson, T
Định dạng: Journal article
Ngôn ngữ:English
Được phát hành: 2004

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