Simulations of the inelastic response of silicon to shock compression
Recent experiments employing nanosecond white-light x-ray di↵raction have demonstrated a complex response of pure, single crystal silicon to shock compression on ultra-fast timescales. We present here details of a Lagrangian code which tracks both longitudinal and transverse strains, and successfull...
Main Authors: | Stubley, P, Higginbotham, A, Wark, J |
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Format: | Journal article |
Published: |
Elsevier
2016
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