Nanoscale structural analysis of amorphous materials

Reduced density function (G(r)) analysis of energy filtered electron diffraction data provides structural information from small volumes of amorphous materials. Improvements in transmission electron microscopes, energy filters and data recording devices (CCDs) have made it possible to perform G(r) a...

Повний опис

Бібліографічні деталі
Автори: McBride, W, Cockayne, D
Формат: Conference item
Опубліковано: 2001

Схожі ресурси