Soft x-ray photoelectron spectroscopy of tin-phthalocyanine/GaAs(001)-1 x 6 interface formation
The surface sensitivity of soft x-ray photoelectron spectroscopy is exploited to probe the structural, electronic and chemical properties of an organic/inorganic semiconductor interface. Thin films of tin-phthalocyanine (SnPc) are deposited on a GaAs(001)-1 × 6 surface, prepared by argon ion bombard...
| Main Authors: | , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2003
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