Three-dimensional atomic scale analysis of interfaces
The 3-dimensional atom probe (3DAP) permits analysis of the elemental distributions within a small volume of material, typically 20x20x100nm, with near atomic-resolution. This technique has been used to study segregation to grain boundaries in electrodeposited nanocrystalline nickel and Ni-P. To stu...
| Main Authors: | , , , , , , , |
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| Format: | Conference item |
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1999
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| _version_ | 1797105777474797568 |
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| author | Cerezo, A Abraham, M Lane, H Larson, D Thuvander, M Seto, K Warren, P Smith, G |
| author_facet | Cerezo, A Abraham, M Lane, H Larson, D Thuvander, M Seto, K Warren, P Smith, G |
| author_sort | Cerezo, A |
| collection | OXFORD |
| description | The 3-dimensional atom probe (3DAP) permits analysis of the elemental distributions within a small volume of material, typically 20x20x100nm, with near atomic-resolution. This technique has been used to study segregation to grain boundaries in electrodeposited nanocrystalline nickel and Ni-P. To study boundaries in coarse grained material, selected area specimen preparation methods are essential. Focussed ion-beam milling has been used to prepare specimens from interstitial free steels, permitting 3DAP analysis of segregation. 3DAP data can also contain detailed lattice information. Fourier transforms are being used to generate lattice spots in 3D diffraction space which can be used to determine the grain orientations. This opens up the possibility of combining atomic-scale chemical and crystallographic analysis within a single experiment. |
| first_indexed | 2024-03-07T06:52:13Z |
| format | Conference item |
| id | oxford-uuid:fceadf74-7326-4df6-aebb-ef3bf9d35716 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T06:52:13Z |
| publishDate | 1999 |
| record_format | dspace |
| spelling | oxford-uuid:fceadf74-7326-4df6-aebb-ef3bf9d357162022-03-27T13:24:50ZThree-dimensional atomic scale analysis of interfacesConference itemhttp://purl.org/coar/resource_type/c_5794uuid:fceadf74-7326-4df6-aebb-ef3bf9d35716Symplectic Elements at Oxford1999Cerezo, AAbraham, MLane, HLarson, DThuvander, MSeto, KWarren, PSmith, GThe 3-dimensional atom probe (3DAP) permits analysis of the elemental distributions within a small volume of material, typically 20x20x100nm, with near atomic-resolution. This technique has been used to study segregation to grain boundaries in electrodeposited nanocrystalline nickel and Ni-P. To study boundaries in coarse grained material, selected area specimen preparation methods are essential. Focussed ion-beam milling has been used to prepare specimens from interstitial free steels, permitting 3DAP analysis of segregation. 3DAP data can also contain detailed lattice information. Fourier transforms are being used to generate lattice spots in 3D diffraction space which can be used to determine the grain orientations. This opens up the possibility of combining atomic-scale chemical and crystallographic analysis within a single experiment. |
| spellingShingle | Cerezo, A Abraham, M Lane, H Larson, D Thuvander, M Seto, K Warren, P Smith, G Three-dimensional atomic scale analysis of interfaces |
| title | Three-dimensional atomic scale analysis of interfaces |
| title_full | Three-dimensional atomic scale analysis of interfaces |
| title_fullStr | Three-dimensional atomic scale analysis of interfaces |
| title_full_unstemmed | Three-dimensional atomic scale analysis of interfaces |
| title_short | Three-dimensional atomic scale analysis of interfaces |
| title_sort | three dimensional atomic scale analysis of interfaces |
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