Three-dimensional atomic scale analysis of interfaces
The 3-dimensional atom probe (3DAP) permits analysis of the elemental distributions within a small volume of material, typically 20x20x100nm, with near atomic-resolution. This technique has been used to study segregation to grain boundaries in electrodeposited nanocrystalline nickel and Ni-P. To stu...
| Main Authors: | , , , , , , , |
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| Format: | Conference item |
| Published: |
1999
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