van den Bos, K., De Backer, A., Martinez, G., Winckelmans, N., Bals, S., Nellist, P., & Van Aert, S. (2016). Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy. American Physical Society.
Cita Chicago (17th ed.)van den Bos, K., A. De Backer, G. Martinez, N. Winckelmans, S. Bals, P. Nellist, i S. Van Aert. Unscrambling Mixed Elements Using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. American Physical Society, 2016.
Cita MLA (9th ed.)van den Bos, K., et al. Unscrambling Mixed Elements Using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. American Physical Society, 2016.
Atenció: Aquestes cites poden no estar 100% correctes.