van den Bos, K., De Backer, A., Martinez, G., Winckelmans, N., Bals, S., Nellist, P., & Van Aert, S. (2016). Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy. American Physical Society.
Chicago Style (17th ed.) Citationvan den Bos, K., A. De Backer, G. Martinez, N. Winckelmans, S. Bals, P. Nellist, and S. Van Aert. Unscrambling Mixed Elements Using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. American Physical Society, 2016.
ציטוט MLAvan den Bos, K., et al. Unscrambling Mixed Elements Using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. American Physical Society, 2016.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.