van den Bos, K., De Backer, A., Martinez, G., Winckelmans, N., Bals, S., Nellist, P., & Van Aert, S. (2016). Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy. American Physical Society.
Chicago Style (17th ed.) Citationvan den Bos, K., A. De Backer, G. Martinez, N. Winckelmans, S. Bals, P. Nellist, and S. Van Aert. Unscrambling Mixed Elements Using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. American Physical Society, 2016.
MLA引文van den Bos, K., et al. Unscrambling Mixed Elements Using High Angle Annular Dark Field Scanning Transmission Electron Microscopy. American Physical Society, 2016.
警告:這些引文格式不一定是100%准確.