Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.
The development of new nanocrystals with outstanding physico-chemical properties requires a full three-dimensional (3D) characterization at the atomic scale. For homogeneous nanocrystals, counting the number of atoms in each atomic column from high angle annular dark field (HAADF) scanning transmiss...
Hlavní autoři: | van den Bos, K, De Backer, A, Martinez, G, Winckelmans, N, Bals, S, Nellist, P, Van Aert, S |
---|---|
Médium: | Journal article |
Jazyk: | English |
Vydáno: |
American Physical Society
2016
|
Podobné jednotky
-
Element specific atom counting at the atomic scale by combining high angle annular dark field scanning transmission electron microscopy and energy dispersive X-ray spectroscopy
Autor: De Backer, A, a další
Vydáno: (2022) -
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.
Autor: De Backer, A, a další
Vydáno: (2015) -
Recent breakthroughs in scanning transmission electron microscopy of small species
Autor: Karel Hendrik Wouter van den Bos, a další
Vydáno: (2018-01-01) -
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
Autor: Martinez, G, a další
Vydáno: (2018) -
Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy
Autor: Van Aert, S, a další
Vydáno: (2019)