Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

The development of new nanocrystals with outstanding physico-chemical properties requires a full three-dimensional (3D) characterization at the atomic scale. For homogeneous nanocrystals, counting the number of atoms in each atomic column from high angle annular dark field (HAADF) scanning transmiss...

Bibliografiset tiedot
Päätekijät:	van den Bos, K, De Backer, A, Martinez, G, Winckelmans, N, Bals, S, Nellist, P, Van Aert, S
Aineistotyyppi:	Journal article
Kieli:	English
Julkaistu:	American Physical Society 2016

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