Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

The development of new nanocrystals with outstanding physico-chemical properties requires a full three-dimensional (3D) characterization at the atomic scale. For homogeneous nanocrystals, counting the number of atoms in each atomic column from high angle annular dark field (HAADF) scanning transmiss...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों:	van den Bos, K, De Backer, A, Martinez, G, Winckelmans, N, Bals, S, Nellist, P, Van Aert, S
स्वरूप:	Journal article
भाषा:	English
प्रकाशित:	American Physical Society 2016

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