Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy.

The development of new nanocrystals with outstanding physico-chemical properties requires a full three-dimensional (3D) characterization at the atomic scale. For homogeneous nanocrystals, counting the number of atoms in each atomic column from high angle annular dark field (HAADF) scanning transmiss...

書誌詳細
主要な著者:	van den Bos, K, De Backer, A, Martinez, G, Winckelmans, N, Bals, S, Nellist, P, Van Aert, S
フォーマット:	Journal article
言語:	English
出版事項:	American Physical Society 2016

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