High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method

High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity wi...

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Main Authors: Ibrahim, N.B., Baqiah, H., Abdullah, M.H.
Format: Article
Language:English
Published: Universiti Kebangsaan Malaysia 2013
Online Access:http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf
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author Ibrahim, N.B.
Baqiah, H.
Abdullah, M.H.
author_facet Ibrahim, N.B.
Baqiah, H.
Abdullah, M.H.
author_sort Ibrahim, N.B.
collection UKM
description High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm.
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spelling ukm.eprints-63132016-12-14T06:40:49Z http://journalarticle.ukm.my/6313/ High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method Ibrahim, N.B. Baqiah, H. Abdullah, M.H. High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm. Universiti Kebangsaan Malaysia 2013-07 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf Ibrahim, N.B. and Baqiah, H. and Abdullah, M.H. (2013) High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method. Sains Malaysiana, 42 (7). pp. 961-966. ISSN 0126-6039 http://www.ukm.my/jsm/
spellingShingle Ibrahim, N.B.
Baqiah, H.
Abdullah, M.H.
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_full High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_fullStr High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_full_unstemmed High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_short High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
title_sort high transparency iron doped indium oxide in2 xfexo3 x 0 0 0 05 0 25 0 35 and 0 45 films prepared by the sol gel method
url http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf
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