High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity wi...
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Format: | Article |
Language: | English |
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Universiti Kebangsaan Malaysia
2013
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Online Access: | http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf |
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author | Ibrahim, N.B. Baqiah, H. Abdullah, M.H. |
author_facet | Ibrahim, N.B. Baqiah, H. Abdullah, M.H. |
author_sort | Ibrahim, N.B. |
collection | UKM |
description | High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm. |
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format | Article |
id | ukm.eprints-6313 |
institution | Universiti Kebangsaan Malaysia |
language | English |
last_indexed | 2024-03-06T04:00:25Z |
publishDate | 2013 |
publisher | Universiti Kebangsaan Malaysia |
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spelling | ukm.eprints-63132016-12-14T06:40:49Z http://journalarticle.ukm.my/6313/ High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method Ibrahim, N.B. Baqiah, H. Abdullah, M.H. High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm. Universiti Kebangsaan Malaysia 2013-07 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf Ibrahim, N.B. and Baqiah, H. and Abdullah, M.H. (2013) High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method. Sains Malaysiana, 42 (7). pp. 961-966. ISSN 0126-6039 http://www.ukm.my/jsm/ |
spellingShingle | Ibrahim, N.B. Baqiah, H. Abdullah, M.H. High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
title | High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
title_full | High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
title_fullStr | High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
title_full_unstemmed | High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
title_short | High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
title_sort | high transparency iron doped indium oxide in2 xfexo3 x 0 0 0 05 0 25 0 35 and 0 45 films prepared by the sol gel method |
url | http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf |
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