Characterization of carbon nanotube doped PEDOT:PSS thin film devices
ITO/PEDOTOPSS/Al devices containing dispersed Carbon Nanotubes (CNTs) and pure PEDOT:PSS are compared. It was found that the conductivity of each CNT doped PEDOT: PSS film was reduced upon application of 20Hz pulses of -20V at reversed bias. Deformation of the aluminium electrode was found to occur...
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| Format: | Article |
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National Institute of Optoelectronics
2010
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| _version_ | 1825720257064468480 |
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| author | Yip, W.S. Woon, Kai Lin |
| author_facet | Yip, W.S. Woon, Kai Lin |
| author_sort | Yip, W.S. |
| collection | UM |
| description | ITO/PEDOTOPSS/Al devices containing dispersed Carbon Nanotubes (CNTs) and pure PEDOT:PSS are compared. It was found that the conductivity of each CNT doped PEDOT: PSS film was reduced upon application of 20Hz pulses of -20V at reversed bias. Deformation of the aluminium electrode was found to occur upon application of voltage on the PEDOT: PSS film. However, no aluminium electrode deformation occurs on CNT-doped PEDOT: PSS films. This was verified by Scanning Electron Microscope (SEM). Depth profiling by Auger spectroscopy indicated high level of oxidation at the aluminium PEDOT: PSS interface for device with pure PEDOT: PSS but significantly less with PEDOT doped with CNTs. Resistance is found to vary in periodic high/low values dependent on direction of voltage sweep. |
| first_indexed | 2024-03-06T05:32:22Z |
| format | Article |
| id | um.eprints-12902 |
| institution | Universiti Malaya |
| last_indexed | 2024-03-06T05:32:22Z |
| publishDate | 2010 |
| publisher | National Institute of Optoelectronics |
| record_format | dspace |
| spelling | um.eprints-129022019-10-08T08:15:34Z http://eprints.um.edu.my/12902/ Characterization of carbon nanotube doped PEDOT:PSS thin film devices Yip, W.S. Woon, Kai Lin Q Science (General) QC Physics ITO/PEDOTOPSS/Al devices containing dispersed Carbon Nanotubes (CNTs) and pure PEDOT:PSS are compared. It was found that the conductivity of each CNT doped PEDOT: PSS film was reduced upon application of 20Hz pulses of -20V at reversed bias. Deformation of the aluminium electrode was found to occur upon application of voltage on the PEDOT: PSS film. However, no aluminium electrode deformation occurs on CNT-doped PEDOT: PSS films. This was verified by Scanning Electron Microscope (SEM). Depth profiling by Auger spectroscopy indicated high level of oxidation at the aluminium PEDOT: PSS interface for device with pure PEDOT: PSS but significantly less with PEDOT doped with CNTs. Resistance is found to vary in periodic high/low values dependent on direction of voltage sweep. National Institute of Optoelectronics 2010-07 Article PeerReviewed Yip, W.S. and Woon, Kai Lin (2010) Characterization of carbon nanotube doped PEDOT:PSS thin film devices. Optoelectronics and Advanced Materials, Rapid Communications, 4 (7). pp. 1037-1039. ISSN 1842-6573, http://oam-rc.inoe.ro/index.php?option=magazine&op=view&idu=1157&catid=52 |
| spellingShingle | Q Science (General) QC Physics Yip, W.S. Woon, Kai Lin Characterization of carbon nanotube doped PEDOT:PSS thin film devices |
| title | Characterization of carbon nanotube doped PEDOT:PSS thin film devices |
| title_full | Characterization of carbon nanotube doped PEDOT:PSS thin film devices |
| title_fullStr | Characterization of carbon nanotube doped PEDOT:PSS thin film devices |
| title_full_unstemmed | Characterization of carbon nanotube doped PEDOT:PSS thin film devices |
| title_short | Characterization of carbon nanotube doped PEDOT:PSS thin film devices |
| title_sort | characterization of carbon nanotube doped pedot pss thin film devices |
| topic | Q Science (General) QC Physics |
| work_keys_str_mv | AT yipws characterizationofcarbonnanotubedopedpedotpssthinfilmdevices AT woonkailin characterizationofcarbonnanotubedopedpedotpssthinfilmdevices |