A new approach to study carrier generation in graphene nanoribbons under lateral bias

This paper presents a new approach to study the effect of carrier generation on the current of graphene nanoribbon field effect transistors, which is normally ignored in current-voltage (I-V) modelling. Two analytical models together with a Monte Carlo approach including the edge effect scattering a...

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Main Authors: Ahmad, Harith, Ghadiry, Mahdiar, Abd Manaf, Asrulnizam
Format: Article
Published: American Scientific Publishers 2016
Subjects:
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author Ahmad, Harith
Ghadiry, Mahdiar
Abd Manaf, Asrulnizam
author_facet Ahmad, Harith
Ghadiry, Mahdiar
Abd Manaf, Asrulnizam
author_sort Ahmad, Harith
collection UM
description This paper presents a new approach to study the effect of carrier generation on the current of graphene nanoribbon field effect transistors, which is normally ignored in current-voltage (I-V) modelling. Two analytical models together with a Monte Carlo approach including the edge effect scattering are used to calculate the current and net generation rate respectively. In addition, two fabricated devices with gate lengths of 20 and 30 nm are employed for verification. We showed that ignoring this effect in the modelling, results in error up to 10% for a typical 30 nm graphene field effect transistor. This approach is useful in modelling and optimization of graphene-based field effect transistors and photo sensors.
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spelling um.eprints-181002019-12-18T08:05:46Z http://eprints.um.edu.my/18100/ A new approach to study carrier generation in graphene nanoribbons under lateral bias Ahmad, Harith Ghadiry, Mahdiar Abd Manaf, Asrulnizam QC Physics This paper presents a new approach to study the effect of carrier generation on the current of graphene nanoribbon field effect transistors, which is normally ignored in current-voltage (I-V) modelling. Two analytical models together with a Monte Carlo approach including the edge effect scattering are used to calculate the current and net generation rate respectively. In addition, two fabricated devices with gate lengths of 20 and 30 nm are employed for verification. We showed that ignoring this effect in the modelling, results in error up to 10% for a typical 30 nm graphene field effect transistor. This approach is useful in modelling and optimization of graphene-based field effect transistors and photo sensors. American Scientific Publishers 2016 Article PeerReviewed Ahmad, Harith and Ghadiry, Mahdiar and Abd Manaf, Asrulnizam (2016) A new approach to study carrier generation in graphene nanoribbons under lateral bias. Materials Express, 6 (3). pp. 283-288. ISSN 2158-5849, DOI https://doi.org/10.1166/mex.2016.1305 <https://doi.org/10.1166/mex.2016.1305>. http://dx.doi.org/10.1166/mex.2016.1305 doi:10.1166/mex.2016.1305
spellingShingle QC Physics
Ahmad, Harith
Ghadiry, Mahdiar
Abd Manaf, Asrulnizam
A new approach to study carrier generation in graphene nanoribbons under lateral bias
title A new approach to study carrier generation in graphene nanoribbons under lateral bias
title_full A new approach to study carrier generation in graphene nanoribbons under lateral bias
title_fullStr A new approach to study carrier generation in graphene nanoribbons under lateral bias
title_full_unstemmed A new approach to study carrier generation in graphene nanoribbons under lateral bias
title_short A new approach to study carrier generation in graphene nanoribbons under lateral bias
title_sort new approach to study carrier generation in graphene nanoribbons under lateral bias
topic QC Physics
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