Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation

The optical transmission measurements are used to determine various optical constants and properties of ZnSxSe1-x thin films prepared by electron beam evaporation onto glass substrates at 60 °C. The dispersion of the complex refractive index, the complex dielectric function and the absorption coeffi...

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Main Authors: Abo-Hassan, Khedr M.M., Muhamad, Muhamad Rasat, Radhakrishna, S.
Format: Article
Published: Elsevier 2005
Subjects:
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author Abo-Hassan, Khedr M.M.
Muhamad, Muhamad Rasat
Radhakrishna, S.
author_facet Abo-Hassan, Khedr M.M.
Muhamad, Muhamad Rasat
Radhakrishna, S.
author_sort Abo-Hassan, Khedr M.M.
collection UM
description The optical transmission measurements are used to determine various optical constants and properties of ZnSxSe1-x thin films prepared by electron beam evaporation onto glass substrates at 60 °C. The dispersion of the complex refractive index, the complex dielectric function and the absorption coefficient is studied in the transparent region of the spectrum and compared with the theoretical results calculated based on the model dielectric function. The fundamental optical energy gap is estimated by fitting the absorption coefficient data in the high absorption region to the direct transition expression. The variation of the energy gap with the composition in the film is investigated and compared with the results reported previously by other workers. The shift in the energy gap caused by the uniaxial stress inside the film and the grain size effect is estimated. © 2005 Elsevier B.V. All rights reserved.
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spelling um.eprints-244592020-05-29T01:41:42Z http://eprints.um.edu.my/24459/ Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation Abo-Hassan, Khedr M.M. Muhamad, Muhamad Rasat Radhakrishna, S. Q Science (General) QC Physics The optical transmission measurements are used to determine various optical constants and properties of ZnSxSe1-x thin films prepared by electron beam evaporation onto glass substrates at 60 °C. The dispersion of the complex refractive index, the complex dielectric function and the absorption coefficient is studied in the transparent region of the spectrum and compared with the theoretical results calculated based on the model dielectric function. The fundamental optical energy gap is estimated by fitting the absorption coefficient data in the high absorption region to the direct transition expression. The variation of the energy gap with the composition in the film is investigated and compared with the results reported previously by other workers. The shift in the energy gap caused by the uniaxial stress inside the film and the grain size effect is estimated. © 2005 Elsevier B.V. All rights reserved. Elsevier 2005 Article PeerReviewed Abo-Hassan, Khedr M.M. and Muhamad, Muhamad Rasat and Radhakrishna, S. (2005) Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation. Thin Solid Films, 491 (1-2). pp. 117-122. ISSN 0040-6090, DOI https://doi.org/10.1016/j.tsf.2005.05.045 <https://doi.org/10.1016/j.tsf.2005.05.045>. https://doi.org/10.1016/j.tsf.2005.05.045 doi:10.1016/j.tsf.2005.05.045
spellingShingle Q Science (General)
QC Physics
Abo-Hassan, Khedr M.M.
Muhamad, Muhamad Rasat
Radhakrishna, S.
Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation
title Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation
title_full Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation
title_fullStr Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation
title_full_unstemmed Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation
title_short Optical characteristics of ZnSxSe1−x thin films prepared by electron beam evaporation
title_sort optical characteristics of znsxse1 x thin films prepared by electron beam evaporation
topic Q Science (General)
QC Physics
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AT muhamadmuhamadrasat opticalcharacteristicsofznsxse1xthinfilmspreparedbyelectronbeamevaporation
AT radhakrishnas opticalcharacteristicsofznsxse1xthinfilmspreparedbyelectronbeamevaporation