Zhao, F., Wang, Y., Guo, W., Cong, J., Tee, C. A. T. H., Song, L., & Zheng, Y. (2020). Analysis of the eight parameter variation of the resonant tunneling diode (RTD) in the rapid thermal annealing process with resistance compensation effect. American Institute of Physics.
Chicago Style (17th ed.) CitationZhao, Fan, Yidian Wang, Weilian Guo, Jia Cong, Clarence Augustine Teck Huo Tee, Le Song, and Yelong Zheng. Analysis of the Eight Parameter Variation of the Resonant Tunneling Diode (RTD) in the Rapid Thermal Annealing Process with Resistance Compensation Effect. American Institute of Physics, 2020.
MLA (9th ed.) CitationZhao, Fan, et al. Analysis of the Eight Parameter Variation of the Resonant Tunneling Diode (RTD) in the Rapid Thermal Annealing Process with Resistance Compensation Effect. American Institute of Physics, 2020.