Characterization of electron beam evaporated cdte thin films for optoelectronic devices
Thin films of CdTe with different film thickness have been grown on glass substrates with different film thickness by electron beam evaporation technique. The influence of the thickness and annealing temperature on the structural, optical and electrical characteristics of CdTe films have been invest...
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| Format: | Article |
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2009
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| Subjects: |