Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis
This work presents an experimental study of gold-DNA-gold structures in the presence and absence of external magnetic fields with strengths less than 1,200.00 mT. The DNA strands, extracted by standard method were used to fabricate a Metal-DNA-Metal (MDM) structure. Its electric behavior when subjec...
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Format: | Article |
Language: | English |
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2012
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Online Access: | http://eprints.um.edu.my/5696/1/Electrical_Characterization_of_Gold-DNA-Gold_Structures_in_Presence_of_an_External_Magnetic_Field_by_Means_of_I-V_Curve_Analysis.pdf |
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author | Khatir, N.M. Banihashemian, S.M. Periasamy, V. Ritikos, R. Abd Majid, Wan Haliza Rahman, S.A. |
author_facet | Khatir, N.M. Banihashemian, S.M. Periasamy, V. Ritikos, R. Abd Majid, Wan Haliza Rahman, S.A. |
author_sort | Khatir, N.M. |
collection | UM |
description | This work presents an experimental study of gold-DNA-gold structures in the presence and absence of external magnetic fields with strengths less than 1,200.00 mT. The DNA strands, extracted by standard method were used to fabricate a Metal-DNA-Metal (MDM) structure. Its electric behavior when subjected to a magnetic field was studied through its current-voltage (I-V) curve. Acquisition of the I-V curve demonstrated that DNA as a semiconductor exhibits diode behavior in the MDM structure. The current versus magnetic field strength followed a decreasing trend because of a diminished mobility in the presence of a low magnetic field. This made clear that an externally imposed magnetic field would boost resistance of the MDM structure up to 1,000.00 mT and for higher magnetic field strengths we can observe an increase in potential barrier in MDM junction. The magnetic sensitivity indicates the promise of using MDM structures as potential magnetic sensors. |
first_indexed | 2024-03-06T05:15:00Z |
format | Article |
id | um.eprints-5696 |
institution | Universiti Malaya |
language | English |
last_indexed | 2024-03-06T05:15:00Z |
publishDate | 2012 |
record_format | dspace |
spelling | um.eprints-56962019-12-18T08:04:09Z http://eprints.um.edu.my/5696/ Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis Khatir, N.M. Banihashemian, S.M. Periasamy, V. Ritikos, R. Abd Majid, Wan Haliza Rahman, S.A. QC Physics This work presents an experimental study of gold-DNA-gold structures in the presence and absence of external magnetic fields with strengths less than 1,200.00 mT. The DNA strands, extracted by standard method were used to fabricate a Metal-DNA-Metal (MDM) structure. Its electric behavior when subjected to a magnetic field was studied through its current-voltage (I-V) curve. Acquisition of the I-V curve demonstrated that DNA as a semiconductor exhibits diode behavior in the MDM structure. The current versus magnetic field strength followed a decreasing trend because of a diminished mobility in the presence of a low magnetic field. This made clear that an externally imposed magnetic field would boost resistance of the MDM structure up to 1,000.00 mT and for higher magnetic field strengths we can observe an increase in potential barrier in MDM junction. The magnetic sensitivity indicates the promise of using MDM structures as potential magnetic sensors. 2012 Article PeerReviewed application/pdf en http://eprints.um.edu.my/5696/1/Electrical_Characterization_of_Gold-DNA-Gold_Structures_in_Presence_of_an_External_Magnetic_Field_by_Means_of_I-V_Curve_Analysis.pdf Khatir, N.M. and Banihashemian, S.M. and Periasamy, V. and Ritikos, R. and Abd Majid, Wan Haliza and Rahman, S.A. (2012) Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis. Sensors, 12 (3). pp. 3578-3586. ISSN 1424-8220, DOI https://doi.org/10.3390/s120303578 <https://doi.org/10.3390/s120303578>. 10.3390/s120303578 |
spellingShingle | QC Physics Khatir, N.M. Banihashemian, S.M. Periasamy, V. Ritikos, R. Abd Majid, Wan Haliza Rahman, S.A. Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis |
title | Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis |
title_full | Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis |
title_fullStr | Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis |
title_full_unstemmed | Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis |
title_short | Electrical Characterization of Gold-DNA-Gold Structures in Presence of an External Magnetic Field by Means of I-V Curve Analysis |
title_sort | electrical characterization of gold dna gold structures in presence of an external magnetic field by means of i v curve analysis |
topic | QC Physics |
url | http://eprints.um.edu.my/5696/1/Electrical_Characterization_of_Gold-DNA-Gold_Structures_in_Presence_of_an_External_Magnetic_Field_by_Means_of_I-V_Curve_Analysis.pdf |
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