An effective simulation analysis of transient electromagnetic multiple faults
Embedded encryption devices and smart sensors are vulnerable to physical attacks. Due to the continuous shrinking of chip size, laser injection, particle radiation and electromagnetic transient injection are possible methods that introduce transient multiple faults. In the fault analysis stage, the...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2020
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| Subjects: | |
| Online Access: | https://eprints.ums.edu.my/id/eprint/25518/1/An%20effective%20simulation%20analysis%20of%20transient%20electromagnetic%20multiple%20faults.pdf |