Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide
The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for...
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| Format: | Article |
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Institute of Electrical and Electronics Engineers
2001
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| _version_ | 1825940049571610624 |
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| author | Abbas, Z. Pollard, R.D. Kelsall, R.W. |
| author_facet | Abbas, Z. Pollard, R.D. Kelsall, R.W. |
| author_sort | Abbas, Z. |
| collection | UPM |
| description | The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured sample thickness is presented. |
| first_indexed | 2025-03-07T12:55:28Z |
| format | Article |
| id | upm.eprints-111956 |
| institution | Universiti Putra Malaysia |
| last_indexed | 2025-03-07T12:55:28Z |
| publishDate | 2001 |
| publisher | Institute of Electrical and Electronics Engineers |
| record_format | dspace |
| spelling | upm.eprints-1119562025-02-20T05:02:25Z http://psasir.upm.edu.my/id/eprint/111956/ Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide Abbas, Z. Pollard, R.D. Kelsall, R.W. The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured sample thickness is presented. Institute of Electrical and Electronics Engineers 2001 Article PeerReviewed Abbas, Z. and Pollard, R.D. and Kelsall, R.W. (2001) Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide. IEEE Transactions on Instrumentation and Measurement, 50 (5). pp. 1334-1342. ISSN 0018-9456; eISSN: 1557-9662 https://ieeexplore.ieee.org/document/963207/ 10.1109/19.963207 |
| spellingShingle | Abbas, Z. Pollard, R.D. Kelsall, R.W. Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide |
| title | Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide |
| title_full | Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide |
| title_fullStr | Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide |
| title_full_unstemmed | Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide |
| title_short | Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide |
| title_sort | complex permittivity measurements at ka band using rectangular dielectric waveguide |
| work_keys_str_mv | AT abbasz complexpermittivitymeasurementsatkabandusingrectangulardielectricwaveguide AT pollardrd complexpermittivitymeasurementsatkabandusingrectangulardielectricwaveguide AT kelsallrw complexpermittivitymeasurementsatkabandusingrectangulardielectricwaveguide |