Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time...
Main Authors: | Ebrahimiasl, Saeideh, Wan Yunus, Wan Md. Zin, Kassim, Anuar, Zainal, Zulkarnain |
---|---|
Format: | Article |
Language: | English English |
Published: |
Elsevier
2010
|
Subjects: | |
Online Access: | http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf |
Similar Items
-
Development of nanocrystalline thick film gas sensors
by: Abadi, Mohammad Hadi Nezhad Shahrokh
Published: (2010) -
Preparation of tin seleno telluride thin films by potentiostatic and pulse electrodepositon techniques
by: Chia, Chew Ping
Published: (2015) -
Thickness-Induced Metal-Insulator Transition in Sb-doped SnO2 Ultrathin Films: The Role of Quantum Confinement
by: Ke, Chang, et al.
Published: (2015) -
A method for depositing tin oxide film.
by: Wan Yunus, Wan Md. Zin, et al.
Published: (2011) -
Preparation and characterization of nanocrystalline SnΟ₂thin film by chemical bath deposition for solar cell application
by: Wan Yunus, Wan Md. Zin, et al.
Published: (2009)