Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film
The optical properties of an ultra-thin conducting polymer film was investigated using surface plasmon resonance (SPR) reflectometry system consisting of 2 mW He-Ne 632.8nm solid state laser. Real part of the complex permittivity decreases with thickness, but remains between 2.0-3.0 for films thicke...
| Автори: | , , |
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| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Praise Worthy Prize
2009
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| Онлайн доступ: | http://psasir.upm.edu.my/id/eprint/16904/1/16904.pdf |
| _version_ | 1825945906283806720 |
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| author | Abdul Wahab, M. R. Din, M. Jusoff, Kamaruzaman |
| author_facet | Abdul Wahab, M. R. Din, M. Jusoff, Kamaruzaman |
| author_sort | Abdul Wahab, M. R. |
| collection | UPM |
| description | The optical properties of an ultra-thin conducting polymer film was investigated using surface plasmon resonance (SPR) reflectometry system consisting of 2 mW He-Ne 632.8nm solid state laser. Real part of the complex permittivity decreases with thickness, but remains between 2.0-3.0 for films thicker than 30 nm. Exposure to HCl vapour is expected to increase conductivity. Shifting and shallowing of SPR curves with the length of exposure to HCl exhibit increase in conducting properties. |
| first_indexed | 2024-03-06T07:38:48Z |
| format | Article |
| id | upm.eprints-16904 |
| institution | Universiti Putra Malaysia |
| language | English |
| last_indexed | 2024-03-06T07:38:48Z |
| publishDate | 2009 |
| publisher | Praise Worthy Prize |
| record_format | dspace |
| spelling | upm.eprints-169042016-02-01T02:31:15Z http://psasir.upm.edu.my/id/eprint/16904/ Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film Abdul Wahab, M. R. Din, M. Jusoff, Kamaruzaman The optical properties of an ultra-thin conducting polymer film was investigated using surface plasmon resonance (SPR) reflectometry system consisting of 2 mW He-Ne 632.8nm solid state laser. Real part of the complex permittivity decreases with thickness, but remains between 2.0-3.0 for films thicker than 30 nm. Exposure to HCl vapour is expected to increase conductivity. Shifting and shallowing of SPR curves with the length of exposure to HCl exhibit increase in conducting properties. Praise Worthy Prize 2009 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/16904/1/16904.pdf Abdul Wahab, M. R. and Din, M. and Jusoff, Kamaruzaman (2009) Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film. International Review of Physics, 3 (4). pp. 228-232. ISSN 1971-680X; ESSN: 1971-6796 |
| spellingShingle | Abdul Wahab, M. R. Din, M. Jusoff, Kamaruzaman Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film |
| title | Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film
|
| title_full | Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film
|
| title_fullStr | Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film
|
| title_full_unstemmed | Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film
|
| title_short | Surface plasmon resonance study on the characteristics of a conducting polymer ultra-thin film
|
| title_sort | surface plasmon resonance study on the characteristics of a conducting polymer ultra thin film |
| url | http://psasir.upm.edu.my/id/eprint/16904/1/16904.pdf |
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