X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.
Semiconductor thin films copper tin selenide, Cu2SnSe3, a potential compound for solar cell applications or semiconductor radiation detector were prepared by thermal evaporation method onto well-cleaned glass substrates. The as-deposited films were annealed in flowing purified nitrogen, N2, for 2 h...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English English |
| Published: |
David Publishing Company
2010
|
| Subjects: | |
| Online Access: | http://psasir.upm.edu.my/id/eprint/17666/1/X-Ray%20diffraction%20analysis%20of%20thermally%20evaporated%20copper%20tin%20selenide%20thin%20films%20at%20different%20annealing%20temperature..pdf |
| _version_ | 1825946055034798080 |
|---|---|
| author | Talib, Zainal Abidin Mat Yunus, Wan Mahmood Mohd Yunos, Mohd Amirul Syafiq Meor Sulaiman, Meor Yusoff Paulus, Wilfred Sylvester |
| author_facet | Talib, Zainal Abidin Mat Yunus, Wan Mahmood Mohd Yunos, Mohd Amirul Syafiq Meor Sulaiman, Meor Yusoff Paulus, Wilfred Sylvester |
| author_sort | Talib, Zainal Abidin |
| collection | UPM |
| description | Semiconductor thin films copper tin selenide, Cu2SnSe3, a potential compound for solar cell applications or semiconductor radiation detector were prepared by thermal evaporation method onto well-cleaned glass substrates. The as-deposited films were annealed in flowing purified nitrogen, N2, for 2 h in the temperature range from 100 °C to 500 °C. The structure of as-deposited and annealed films has been studied by X-ray diffraction technique. The semi-quantitative analysis indicated from the Reitveld refinement show that the samples composed of Cu2SnSe3 and SnSe. These studies revealed that the films were structured in mixed phase between cubic space group F-43m (no. 216) and orthorhombic space group P n m a (no. 62). The crystallite size and lattice strain were determined from Scherrer calculation method. The results show that increasing in annealing temperature resulted in direct increase in crystallite size and decrease in lattice strain. |
| first_indexed | 2024-03-06T07:41:06Z |
| format | Article |
| id | upm.eprints-17666 |
| institution | Universiti Putra Malaysia |
| language | English English |
| last_indexed | 2024-03-06T07:41:06Z |
| publishDate | 2010 |
| publisher | David Publishing Company |
| record_format | dspace |
| spelling | upm.eprints-176662016-01-19T03:09:32Z http://psasir.upm.edu.my/id/eprint/17666/ X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. Talib, Zainal Abidin Mat Yunus, Wan Mahmood Mohd Yunos, Mohd Amirul Syafiq Meor Sulaiman, Meor Yusoff Paulus, Wilfred Sylvester Semiconductor thin films copper tin selenide, Cu2SnSe3, a potential compound for solar cell applications or semiconductor radiation detector were prepared by thermal evaporation method onto well-cleaned glass substrates. The as-deposited films were annealed in flowing purified nitrogen, N2, for 2 h in the temperature range from 100 °C to 500 °C. The structure of as-deposited and annealed films has been studied by X-ray diffraction technique. The semi-quantitative analysis indicated from the Reitveld refinement show that the samples composed of Cu2SnSe3 and SnSe. These studies revealed that the films were structured in mixed phase between cubic space group F-43m (no. 216) and orthorhombic space group P n m a (no. 62). The crystallite size and lattice strain were determined from Scherrer calculation method. The results show that increasing in annealing temperature resulted in direct increase in crystallite size and decrease in lattice strain. David Publishing Company 2010 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/17666/1/X-Ray%20diffraction%20analysis%20of%20thermally%20evaporated%20copper%20tin%20selenide%20thin%20films%20at%20different%20annealing%20temperature..pdf Talib, Zainal Abidin and Mat Yunus, Wan Mahmood and Mohd Yunos, Mohd Amirul Syafiq and Meor Sulaiman, Meor Yusoff and Paulus, Wilfred Sylvester (2010) X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. Journal of Materials Science and Engineering, 4 (12 (Serial No. 37)). pp. 28-33. ISSN 1934-8959 X-rays - Diffraction. Evaporation. Heat - Transmission. English |
| spellingShingle | X-rays - Diffraction. Evaporation. Heat - Transmission. Talib, Zainal Abidin Mat Yunus, Wan Mahmood Mohd Yunos, Mohd Amirul Syafiq Meor Sulaiman, Meor Yusoff Paulus, Wilfred Sylvester X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. |
| title | X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. |
| title_full | X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. |
| title_fullStr | X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. |
| title_full_unstemmed | X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. |
| title_short | X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. |
| title_sort | x ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature |
| topic | X-rays - Diffraction. Evaporation. Heat - Transmission. |
| url | http://psasir.upm.edu.my/id/eprint/17666/1/X-Ray%20diffraction%20analysis%20of%20thermally%20evaporated%20copper%20tin%20selenide%20thin%20films%20at%20different%20annealing%20temperature..pdf |
| work_keys_str_mv | AT talibzainalabidin xraydiffractionanalysisofthermallyevaporatedcoppertinselenidethinfilmsatdifferentannealingtemperature AT matyunuswanmahmood xraydiffractionanalysisofthermallyevaporatedcoppertinselenidethinfilmsatdifferentannealingtemperature AT mohdyunosmohdamirulsyafiq xraydiffractionanalysisofthermallyevaporatedcoppertinselenidethinfilmsatdifferentannealingtemperature AT meorsulaimanmeoryusoff xraydiffractionanalysisofthermallyevaporatedcoppertinselenidethinfilmsatdifferentannealingtemperature AT pauluswilfredsylvester xraydiffractionanalysisofthermallyevaporatedcoppertinselenidethinfilmsatdifferentannealingtemperature |