A procedure of a test pattern generation for CMOS operational amplifier based on the inverting amplifier
The microchip, an ultra-small and fragile electrical system is prone to damage either during the fabrication process or during the operation of the device itself. In microchip production, the final products are all identical because a master mold is used for production. This also implies that there...
| Main Authors: | , , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
Universiti Putra Malaysia Press
2002
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| Online Access: | http://psasir.upm.edu.my/id/eprint/18388/1/18388.pdf |