Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Malaysian Solid State Science and Technology Society
2014
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| Online Access: | http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf |
| Summary: | By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm. |
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