Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate

By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average...

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Main Authors: Navaseri, M., Shaari, Abdul Halim, Lim, Kean Pah, Chen, Soo Kien, Abd Shukor, Roslan
Format: Article
Language:English
Published: Malaysian Solid State Science and Technology Society 2014
Online Access:http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf
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author Navaseri, M.
Shaari, Abdul Halim
Lim, Kean Pah
Chen, Soo Kien
Abd Shukor, Roslan
author_facet Navaseri, M.
Shaari, Abdul Halim
Lim, Kean Pah
Chen, Soo Kien
Abd Shukor, Roslan
author_sort Navaseri, M.
collection UPM
description By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm.
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spelling upm.eprints-378022015-12-04T02:14:27Z http://psasir.upm.edu.my/id/eprint/37802/ Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate Navaseri, M. Shaari, Abdul Halim Lim, Kean Pah Chen, Soo Kien Abd Shukor, Roslan By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm. Malaysian Solid State Science and Technology Society 2014 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf Navaseri, M. and Shaari, Abdul Halim and Lim, Kean Pah and Chen, Soo Kien and Abd Shukor, Roslan (2014) Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate. Solid State Science and Technology, 22 (1&2). pp. 66-72. ISSN 0128-7389 http://journal.masshp.net/vol-22-no-1-2-2014/
spellingShingle Navaseri, M.
Shaari, Abdul Halim
Lim, Kean Pah
Chen, Soo Kien
Abd Shukor, Roslan
Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
title Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
title_full Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
title_fullStr Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
title_full_unstemmed Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
title_short Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
title_sort growth and characterization of la5 8ca3 8mno3 films by pulsed laser deposition on silicon wafer substrate
url http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf
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