Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate
By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average...
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Format: | Article |
Language: | English |
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Malaysian Solid State Science and Technology Society
2014
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Online Access: | http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf |
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author | Navaseri, M. Shaari, Abdul Halim Lim, Kean Pah Chen, Soo Kien Abd Shukor, Roslan |
author_facet | Navaseri, M. Shaari, Abdul Halim Lim, Kean Pah Chen, Soo Kien Abd Shukor, Roslan |
author_sort | Navaseri, M. |
collection | UPM |
description | By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm. |
first_indexed | 2024-03-06T08:39:25Z |
format | Article |
id | upm.eprints-37802 |
institution | Universiti Putra Malaysia |
language | English |
last_indexed | 2024-03-06T08:39:25Z |
publishDate | 2014 |
publisher | Malaysian Solid State Science and Technology Society |
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spelling | upm.eprints-378022015-12-04T02:14:27Z http://psasir.upm.edu.my/id/eprint/37802/ Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate Navaseri, M. Shaari, Abdul Halim Lim, Kean Pah Chen, Soo Kien Abd Shukor, Roslan By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm. Malaysian Solid State Science and Technology Society 2014 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf Navaseri, M. and Shaari, Abdul Halim and Lim, Kean Pah and Chen, Soo Kien and Abd Shukor, Roslan (2014) Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate. Solid State Science and Technology, 22 (1&2). pp. 66-72. ISSN 0128-7389 http://journal.masshp.net/vol-22-no-1-2-2014/ |
spellingShingle | Navaseri, M. Shaari, Abdul Halim Lim, Kean Pah Chen, Soo Kien Abd Shukor, Roslan Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate |
title | Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate |
title_full | Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate |
title_fullStr | Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate |
title_full_unstemmed | Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate |
title_short | Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate |
title_sort | growth and characterization of la5 8ca3 8mno3 films by pulsed laser deposition on silicon wafer substrate |
url | http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf |
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