Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application
Surface plasmon resonance (SPR) is a quantum electromagnetic phenomenon arising from the interaction of light with free electrons at a metal-dielectric interface. SPR has emerged as a powerful optical sensor based on the sensing of the change in refractive index of a medium adjacent to the metal sur...
| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Language: | English |
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American Institute of Physics
2012
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| Online Access: | http://psasir.upm.edu.my/id/eprint/57450/1/Optical%20characterization%20of%20multi%20layer%20thin%20films%20using%20surface%20plasmon%20resonance%20method%20from%20electromagnetic%20theory%20to%20sensor%20application.pdf |
| _version_ | 1825931614903861248 |
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| author | Yap, Wing Fen Mat Yunus, Wan Mahmood |
| author_facet | Yap, Wing Fen Mat Yunus, Wan Mahmood |
| author_sort | Yap, Wing Fen |
| collection | UPM |
| description | Surface plasmon resonance (SPR) is a quantum electromagnetic phenomenon arising from the interaction of light with free electrons at a metal-dielectric interface. SPR has emerged as a powerful optical sensor based on the sensing of the change in refractive index of a medium adjacent to the metal surface layer. In the present work, the data analysis in SPR method which involves determination of optical constants and thicknesses of multi layer thin films was investigated based on Kretschmann configuration. The SPR experimental results (reflectance versus incident angle plots) were analyzed by using Maxwell's and Fresnel's equations. The calculations involve transfer matrix method where the unknown optical parameters were obtained by fitting experimental SPR plots to calculated theoretical results. The utility of this transfer matrix has also been demonstrated for recently reported SPR experiment on sensor application. |
| first_indexed | 2024-03-06T09:29:26Z |
| format | Conference or Workshop Item |
| id | upm.eprints-57450 |
| institution | Universiti Putra Malaysia |
| language | English |
| last_indexed | 2024-03-06T09:29:26Z |
| publishDate | 2012 |
| publisher | American Institute of Physics |
| record_format | dspace |
| spelling | upm.eprints-574502017-09-27T10:46:58Z http://psasir.upm.edu.my/id/eprint/57450/ Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application Yap, Wing Fen Mat Yunus, Wan Mahmood Surface plasmon resonance (SPR) is a quantum electromagnetic phenomenon arising from the interaction of light with free electrons at a metal-dielectric interface. SPR has emerged as a powerful optical sensor based on the sensing of the change in refractive index of a medium adjacent to the metal surface layer. In the present work, the data analysis in SPR method which involves determination of optical constants and thicknesses of multi layer thin films was investigated based on Kretschmann configuration. The SPR experimental results (reflectance versus incident angle plots) were analyzed by using Maxwell's and Fresnel's equations. The calculations involve transfer matrix method where the unknown optical parameters were obtained by fitting experimental SPR plots to calculated theoretical results. The utility of this transfer matrix has also been demonstrated for recently reported SPR experiment on sensor application. American Institute of Physics 2012 Conference or Workshop Item PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/57450/1/Optical%20characterization%20of%20multi%20layer%20thin%20films%20using%20surface%20plasmon%20resonance%20method%20from%20electromagnetic%20theory%20to%20sensor%20application.pdf Yap, Wing Fen and Mat Yunus, Wan Mahmood (2012) Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application. In: 2nd International Conference on Fundamental and Applied Sciences (ICFAS2012), 12-14 June 2012, Kuala Lumpur Convention Centre, Kuala Lumpur. (pp. 132-135). 10.1063/1.4757452 |
| spellingShingle | Yap, Wing Fen Mat Yunus, Wan Mahmood Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application |
| title | Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application |
| title_full | Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application |
| title_fullStr | Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application |
| title_full_unstemmed | Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application |
| title_short | Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application |
| title_sort | optical characterization of multi layer thin films using surface plasmon resonance method from electromagnetic theory to sensor application |
| url | http://psasir.upm.edu.my/id/eprint/57450/1/Optical%20characterization%20of%20multi%20layer%20thin%20films%20using%20surface%20plasmon%20resonance%20method%20from%20electromagnetic%20theory%20to%20sensor%20application.pdf |
| work_keys_str_mv | AT yapwingfen opticalcharacterizationofmultilayerthinfilmsusingsurfaceplasmonresonancemethodfromelectromagnetictheorytosensorapplication AT matyunuswanmahmood opticalcharacterizationofmultilayerthinfilmsusingsurfaceplasmonresonancemethodfromelectromagnetictheorytosensorapplication |