Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency
Dynamic Thermal Management (DTM) emerged as a solution to address the reliability challenges with thermal hotspots and unbalanced temperatures. DTM efficiency is highly affected by the accuracy of the temperature information presented to the DTM manager. This work aims to investigate the effect of i...
| Principais autores: | , , , , |
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| Formato: | Conference or Workshop Item |
| Idioma: | English |
| Publicado em: |
IEEE
2015
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| Acesso em linha: | http://psasir.upm.edu.my/id/eprint/69673/1/Investigating%20the%20impact%20of%20on-chip%20interconnection%20noise%20on%20dynamic%20thermal%20management%20efficiency.pdf |