EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS

Since the run length distribution is generally highly skewed, a significant concern about focusing too much on the average run length (ARL) criterion is that we may miss some crucial information about a control chart’s performance. Thus it is important to investigate the entire run length distributi...

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Main Authors: Teoh, W. L., Fun, M. S., Teh, S. Y., Khoo, Michael B. C., Yeong, W. C.
Format: Article
Language:English
Published: Stellenbosch University 2016
Subjects:
Online Access:http://eprints.usm.my/36940/1/%28EXACT_RUN_LENGTH_DISTRIBUTION%29_978-5080-1-PB.pdf
_version_ 1825833565859872768
author Teoh, W. L.
Fun, M. S.
Teh, S. Y.
Khoo, Michael B. C.
Yeong, W. C.
author_facet Teoh, W. L.
Fun, M. S.
Teh, S. Y.
Khoo, Michael B. C.
Yeong, W. C.
author_sort Teoh, W. L.
collection USM
description Since the run length distribution is generally highly skewed, a significant concern about focusing too much on the average run length (ARL) criterion is that we may miss some crucial information about a control chart’s performance. Thus it is important to investigate the entire run length distribution of a control chart for an in-depth understanding before implementing the chart in process monitoring. In this paper, the percentiles of the run length distribution for the double sampling (DS) X chart with estimated process parameters are computed. Knowledge of the percentiles of the run length distribution provides a more comprehensive understanding of the expected behaviour of the run length. This additional information includes the early false alarm, the skewness of the run length distribution, and the median run length (MRL). A comparison of the run length distribution between the optimal ARL-based and MRL-based DS X chart with estimated process parameters is presented in this paper. Examples of applications are given to aid practitioners to select the best design scheme of the DS X chart with estimated process parameters, based on their specific purpose.
first_indexed 2024-03-06T15:09:44Z
format Article
id usm.eprints-36940
institution Universiti Sains Malaysia
language English
last_indexed 2024-03-06T15:09:44Z
publishDate 2016
publisher Stellenbosch University
record_format dspace
spelling usm.eprints-369402017-10-05T03:55:46Z http://eprints.usm.my/36940/ EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS Teoh, W. L. Fun, M. S. Teh, S. Y. Khoo, Michael B. C. Yeong, W. C. HD28-70 Management. Industrial Management QA1-939 Mathematics Since the run length distribution is generally highly skewed, a significant concern about focusing too much on the average run length (ARL) criterion is that we may miss some crucial information about a control chart’s performance. Thus it is important to investigate the entire run length distribution of a control chart for an in-depth understanding before implementing the chart in process monitoring. In this paper, the percentiles of the run length distribution for the double sampling (DS) X chart with estimated process parameters are computed. Knowledge of the percentiles of the run length distribution provides a more comprehensive understanding of the expected behaviour of the run length. This additional information includes the early false alarm, the skewness of the run length distribution, and the median run length (MRL). A comparison of the run length distribution between the optimal ARL-based and MRL-based DS X chart with estimated process parameters is presented in this paper. Examples of applications are given to aid practitioners to select the best design scheme of the DS X chart with estimated process parameters, based on their specific purpose. Stellenbosch University 2016-05 Article PeerReviewed application/pdf en http://eprints.usm.my/36940/1/%28EXACT_RUN_LENGTH_DISTRIBUTION%29_978-5080-1-PB.pdf Teoh, W. L. and Fun, M. S. and Teh, S. Y. and Khoo, Michael B. C. and Yeong, W. C. (2016) EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS. South African Journal of Industrial Engineering, 27 (1). pp. 20-31. ISSN 1012-277X http://www.scielo.org.za/pdf/sajie/v27n1/03.pdf
spellingShingle HD28-70 Management. Industrial Management
QA1-939 Mathematics
Teoh, W. L.
Fun, M. S.
Teh, S. Y.
Khoo, Michael B. C.
Yeong, W. C.
EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS
title EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS
title_full EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS
title_fullStr EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS
title_full_unstemmed EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS
title_short EXACT RUN LENGTH DISTRIBUTION OF THE DOUBLE SAMPLING X CHART WITH ESTIMATED PROCESS PARAMETERS
title_sort exact run length distribution of the double sampling x chart with estimated process parameters
topic HD28-70 Management. Industrial Management
QA1-939 Mathematics
url http://eprints.usm.my/36940/1/%28EXACT_RUN_LENGTH_DISTRIBUTION%29_978-5080-1-PB.pdf
work_keys_str_mv AT teohwl exactrunlengthdistributionofthedoublesamplingxchartwithestimatedprocessparameters
AT funms exactrunlengthdistributionofthedoublesamplingxchartwithestimatedprocessparameters
AT tehsy exactrunlengthdistributionofthedoublesamplingxchartwithestimatedprocessparameters
AT khoomichaelbc exactrunlengthdistributionofthedoublesamplingxchartwithestimatedprocessparameters
AT yeongwc exactrunlengthdistributionofthedoublesamplingxchartwithestimatedprocessparameters