Optimizing Ram Testing Method For Test Time Saving Using Automatic Test Equipment
Due to the memory size increase drastically in the field programable gate array (FPGA) or system on chip (SOC) device, it become hard to meet the tests cost budget of the product especial for low-cost device. One of the major factor of test cost contributed is the test time. For the low-cost product...
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| Format: | Thesis |
| Language: | English |
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2017
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| Online Access: | http://eprints.usm.my/39561/1/PREMKUMAR_AL_KESAVAN_PRABAGARAN-24_Pages.pdf |