Fault Diagnosis On Vlsi Adder Circuits Using Artificial Neural Network
Fault diagnosis on VLSI digital circuit is a technique to detect a fault and the location of the fault that present in a VLSI digital circuit. A faulty circuit in an IC can cause the IC to be malfunctioning and unusable. Therefore, the faulty circuit must be detected during the manufacturing process...
Main Author: | Pui , Min San |
---|---|
Format: | Thesis |
Language: | English |
Published: |
2015
|
Subjects: | |
Online Access: | http://eprints.usm.my/40985/1/PUI_MIN_SAN_24_pages.pdf |
Similar Items
-
Bird sound identification based on artificial neural network
by: Mohd Sukri, Muhammad Mujjajdid, et al.
Published: (2020) -
Improving modified cocomo ii artificial neural network using hyperbolic tangent activation function
by: Abdulaziz Al-Shalif, Sarah Abdulkarem
Published: (2017) -
Design and Implementation of Low Power and High Performance 4 Bit Carry Lookahead Full Adder Using Finfet Technology
by: Lim, Nguk Jie
Published: (2015) -
Hybrid Diagnosis Model To Determine Fault Isolation For Scan Chain Failure Analysis On 22nm Fabrication Process
by: Victor Paulraj, Eric Paulraj
Published: (2016) -
Implementation and self-checking of different adder circuits
by: Hassan, Hasliza
Published: (2020)