Structural And Optical Properties Of Sputtered Nanocrystalline Indium Nitride On Silicon Substrates
The aim of this project is to study the growth and characterization of nanocrystalline indium nitride (InN) on silicon (Si) substrates by means of various non-contact and non-destructive characterization tools. These include the scanning electron microscopy (SEM), energy dispersive X-ray (EDX)...
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| Médium: | Diplomová práce |
| Jazyk: | English |
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2013
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| On-line přístup: | http://eprints.usm.my/43801/1/Maryam%20Amirhoseiny24.pdf |