Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) an...
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2017
|
| Subjects: | |
| Online Access: | http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf |
| _version_ | 1797011581597384704 |
|---|---|
| author | Cha, Hong Ye |
| author_facet | Cha, Hong Ye |
| author_sort | Cha, Hong Ye |
| collection | USM |
| description | Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the
hardware prototype can be designed according to the specifications. Various calibration
methods have been applied to the network analyser to obtain the S-parameters, such as shortopen-
load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW)
demonstrates low loss, compact size, and ease for integration with the planar circuits. In this
research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The
analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed
and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency,
can be measured in the frequency range of 8.0 GHz – 13.0 GHz. The S-parameters of the
prototype are measured by the proposed MTRL kits and compared with commercial SOLT
kits, and validated by FE results. The comparison results between MTRL, SOLT and FE
models for single layer SIW are discussed and analysed. MTRL calibration on single layer
SIW shows deviation of 0 % - 5.0 % of centre frequency, larger operating bandwidth and
closer insertion loss with respect to FE models. Moreover, a good agreement is achieved
between the FE model and experimental results using MTRL calibration for double layer SIW
with rectangular slot. A finite model of double layer SIW with rectangular slot shows four
different resonant frequencies with 2.71 dB insertion loss. The measurement obtained using
the SOLT method displays three different resonant frequencies with 3.41 dB insertion loss. In
contrast, the measurement obtained using MTRL calibration displays four different resonant
frequencies and 2.87 dB insertion loss. Based on these findings, MTRL calibration predicts
more accurately pertaining to single- and multi- layer SIW with close resonant frequencies and
low insertion loss as compared with that of the SOLT method. |
| first_indexed | 2024-03-06T15:36:24Z |
| format | Thesis |
| id | usm.eprints-46475 |
| institution | Universiti Sains Malaysia |
| language | English |
| last_indexed | 2024-03-06T15:36:24Z |
| publishDate | 2017 |
| record_format | dspace |
| spelling | usm.eprints-464752021-11-17T03:42:14Z http://eprints.usm.my/46475/ Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range Cha, Hong Ye T Technology TK1-9971 Electrical engineering. Electronics. Nuclear engineering Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW) demonstrates low loss, compact size, and ease for integration with the planar circuits. In this research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency, can be measured in the frequency range of 8.0 GHz – 13.0 GHz. The S-parameters of the prototype are measured by the proposed MTRL kits and compared with commercial SOLT kits, and validated by FE results. The comparison results between MTRL, SOLT and FE models for single layer SIW are discussed and analysed. MTRL calibration on single layer SIW shows deviation of 0 % - 5.0 % of centre frequency, larger operating bandwidth and closer insertion loss with respect to FE models. Moreover, a good agreement is achieved between the FE model and experimental results using MTRL calibration for double layer SIW with rectangular slot. A finite model of double layer SIW with rectangular slot shows four different resonant frequencies with 2.71 dB insertion loss. The measurement obtained using the SOLT method displays three different resonant frequencies with 3.41 dB insertion loss. In contrast, the measurement obtained using MTRL calibration displays four different resonant frequencies and 2.87 dB insertion loss. Based on these findings, MTRL calibration predicts more accurately pertaining to single- and multi- layer SIW with close resonant frequencies and low insertion loss as compared with that of the SOLT method. 2017-08-01 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf Cha, Hong Ye (2017) Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range. Masters thesis, Universiti Sains Malaysia. |
| spellingShingle | T Technology TK1-9971 Electrical engineering. Electronics. Nuclear engineering Cha, Hong Ye Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range |
| title | Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range |
| title_full | Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range |
| title_fullStr | Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range |
| title_full_unstemmed | Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range |
| title_short | Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range |
| title_sort | thru reflect line trl calibration on multilayer substrate integrated waveguide siw for x band frequency range |
| topic | T Technology TK1-9971 Electrical engineering. Electronics. Nuclear engineering |
| url | http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf |
| work_keys_str_mv | AT chahongye thrureflectlinetrlcalibrationonmultilayersubstrateintegratedwaveguidesiwforxbandfrequencyrange |