Investigation Of Oxidation Process On SOI Wafer
Silicon-on-Insulator, SOI wafer technology is widely used in microelectronic devices due to its advantages that have been used to minimize or eliminate substrate leakage and improve design performance. They have fast speeds, error reduction, low power consumption, increased scaling, and latch-up i...
Main Author: | Salleh, Shaharatul A’ini |
---|---|
Format: | Monograph |
Language: | English |
Published: |
Universiti Sains Malaysia
2022
|
Subjects: | |
Online Access: | http://eprints.usm.my/56673/1/Investigation%20Of%20Oxidation%20Process%20On%20SOI%20Wafer_Shaharatul%20A%E2%80%99ini%20Salleh.pdf |
Similar Items
-
Investigation Of Boron Spin On Dopant On SOI Wafer
by: Bahaudin, Aishah Shamimi
Published: (2022) -
Investigation Of Phosphorus Spin On Dopant On SOI Wafer
by: Tang, Yi Tian
Published: (2022) -
Investigation Of Metal Organic Deposition Derived
Cerium Oxide Thin Films On Silicon Wafer
by: Jasni, Farah Anis
Published: (2009) -
Investigation Of Silver Oxide Nanoparticles In Polymannose Thin Film On Resistive Switching Characteristics
by: Au Yong, Huey Leen
Published: (2022) -
Investigation On Processing Parameter Of Single Screw Extrusion Using Experimental And Numerical Approach
by: Mohd Shah, Mohd Faizatul Shahrizal
Published: (2018)