The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging
The objectives of the project is to investigate the characteristics contact resistance of the silicon lead-frame interface using ECA die attach materials, and to evaluate the factors contributing to the increase of interface resistively in semiconductor packaging. This project was done at ON S...
| Main Author: | |
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| Format: | Thesis |
| Language: | English |
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2004
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| Online Access: | http://eprints.uthm.edu.my/7636/1/24p%20CHUA%20KING%20LEE.pdf |
| _version_ | 1796869599969411072 |
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| author | Chua, King Lee |
| author_facet | Chua, King Lee |
| author_sort | Chua, King Lee |
| collection | UTHM |
| description | The objectives of the project is to investigate the characteristics contact resistance of
the silicon lead-frame interface using ECA die attach materials, and to evaluate the
factors contributing to the increase of interface resistively in semiconductor
packaging. This project was done at ON Semiconductor where silver-filler epoxy�based adhesive chips were investigated.
Tektronix 370B Programmable Curve Tracer with picoprobing is used to
measure RoN of the chips. Nondestructive techniques such as X-ray and SAM used to
examine internal defect and cross sectional analysis was done using SEM.
Few factors were found affect RoN. Those factors are capacitance due to trap
charges during fabrication, supply voltage, thermal management of the package,
delamination between die attachments, thickness of the epox)' and copper dioxide of
the lead-frame. |
| first_indexed | 2024-03-05T21:57:19Z |
| format | Thesis |
| id | uthm.eprints-7636 |
| institution | Universiti Tun Hussein Onn Malaysia |
| language | English |
| last_indexed | 2024-03-05T21:57:19Z |
| publishDate | 2004 |
| record_format | dspace |
| spelling | uthm.eprints-76362022-09-08T02:12:53Z http://eprints.uthm.edu.my/7636/ The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging Chua, King Lee TK Electrical engineering. Electronics Nuclear engineering TK7800-8360 Electronics The objectives of the project is to investigate the characteristics contact resistance of the silicon lead-frame interface using ECA die attach materials, and to evaluate the factors contributing to the increase of interface resistively in semiconductor packaging. This project was done at ON Semiconductor where silver-filler epoxy�based adhesive chips were investigated. Tektronix 370B Programmable Curve Tracer with picoprobing is used to measure RoN of the chips. Nondestructive techniques such as X-ray and SAM used to examine internal defect and cross sectional analysis was done using SEM. Few factors were found affect RoN. Those factors are capacitance due to trap charges during fabrication, supply voltage, thermal management of the package, delamination between die attachments, thickness of the epox)' and copper dioxide of the lead-frame. 2004-03 Thesis NonPeerReviewed text en http://eprints.uthm.edu.my/7636/1/24p%20CHUA%20KING%20LEE.pdf Chua, King Lee (2004) The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging. Masters thesis, Universiti Kebangsaan Malaysia. |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering TK7800-8360 Electronics Chua, King Lee The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging |
| title | The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging |
| title_full | The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging |
| title_fullStr | The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging |
| title_full_unstemmed | The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging |
| title_short | The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging |
| title_sort | investigation on the factors that affect the resistance of drain to source in semiconductor packaging |
| topic | TK Electrical engineering. Electronics Nuclear engineering TK7800-8360 Electronics |
| url | http://eprints.uthm.edu.my/7636/1/24p%20CHUA%20KING%20LEE.pdf |
| work_keys_str_mv | AT chuakinglee theinvestigationonthefactorsthataffecttheresistanceofdraintosourceinsemiconductorpackaging AT chuakinglee investigationonthefactorsthataffecttheresistanceofdraintosourceinsemiconductorpackaging |