Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level
In semiconductor fabrication process, symbol or label inspection is one of the main processes that need to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. Providing a reliab...
| Main Authors: | , , , , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2005
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| Online Access: | http://eprints.utm.my/1842/1/aris05_development_of_software_system.pdf |
| _version_ | 1825909134967439360 |
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| author | Aris, Ishak Azri, Maaspaliza Hasan, Zainab Hasan, M. K. Khalid, Marzuki H. M. Amin, Shamsudin Cyril, H. A. |
| author_facet | Aris, Ishak Azri, Maaspaliza Hasan, Zainab Hasan, M. K. Khalid, Marzuki H. M. Amin, Shamsudin Cyril, H. A. |
| author_sort | Aris, Ishak |
| collection | ePrints |
| description | In semiconductor fabrication process, symbol or label inspection is one of the main processes that need to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. Providing a reliable detection system that is able to detect the errors printed on the IC chip can solve the problem mentioned above. The symbol detection system that currently being implemented by the semiconductor industry suffers from overkilled and escaped problems. This paper presents the development of a software system, which capable of detecting the defective characters printed on the IC chip using Active Matrox Imaging Library Release 7. The proposed system has an adjustable reading level that can solve the problems mentioned above. |
| first_indexed | 2024-03-05T17:57:40Z |
| format | Conference or Workshop Item |
| id | utm.eprints-1842 |
| institution | Universiti Teknologi Malaysia - ePrints |
| language | English |
| last_indexed | 2024-03-05T17:57:40Z |
| publishDate | 2005 |
| record_format | dspace |
| spelling | utm.eprints-18422017-08-27T04:53:24Z http://eprints.utm.my/1842/ Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level Aris, Ishak Azri, Maaspaliza Hasan, Zainab Hasan, M. K. Khalid, Marzuki H. M. Amin, Shamsudin Cyril, H. A. TK Electrical engineering. Electronics Nuclear engineering In semiconductor fabrication process, symbol or label inspection is one of the main processes that need to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. Providing a reliable detection system that is able to detect the errors printed on the IC chip can solve the problem mentioned above. The symbol detection system that currently being implemented by the semiconductor industry suffers from overkilled and escaped problems. This paper presents the development of a software system, which capable of detecting the defective characters printed on the IC chip using Active Matrox Imaging Library Release 7. The proposed system has an adjustable reading level that can solve the problems mentioned above. 2005-12-04 Conference or Workshop Item NonPeerReviewed application/pdf en http://eprints.utm.my/1842/1/aris05_development_of_software_system.pdf Aris, Ishak and Azri, Maaspaliza and Hasan, Zainab and Hasan, M. K. and Khalid, Marzuki and H. M. Amin, Shamsudin and Cyril, H. A. (2005) Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level. In: Proceeding of the 9th International Conference on Mechatronics Technology, 5-8 December 2005, Kuala Lumpur. |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Aris, Ishak Azri, Maaspaliza Hasan, Zainab Hasan, M. K. Khalid, Marzuki H. M. Amin, Shamsudin Cyril, H. A. Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| title | Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| title_full | Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| title_fullStr | Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| title_full_unstemmed | Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| title_short | Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| title_sort | development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://eprints.utm.my/1842/1/aris05_development_of_software_system.pdf |
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