Classification of the marking on integrated circuit chips based on moments and projection profile - a comparison
In this paper, an Industrial machine vision system incorporating Optical Character Recognition (OCR) is employed to inspect the marking on the Integrated Circuit (IC) Chips. This inspection is carried out while the ICs are coming out from the manufacturing line. A TSSOP-DGG type of IC package from T...
Main Authors: | Kartigayan, M., Nagarajan, R., Yaacob, Sazali, Pandian, Paulraj, Rizon, Mohammed, H. M. Amin, Shamsudin, Khalid, Marzuki |
---|---|
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2005
|
Subjects: | |
Online Access: | http://eprints.utm.my/1860/1/Sham05_Classification_of_the_Marking.pdf |
Similar Items
-
A real time marking inspection scheme for semiconductor industries
by: Nagarajan, R., et al.
Published: (2007) -
Object detection using geometric invariant moment
by: Saad, Puteh, et al.
Published: (2006) -
Vowel classification based on frequency response of vocal tract
by: M.P., Paulraj, et al.
Published: (2008) -
Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level
by: Aris, Ishak, et al.
Published: (2005) -
On-chip automatic tuning circuit
by: Htin Kyaw.
Published: (2008)